Monitoring the array in reset-read-read modeShow NOTCam R-R-R database Gain for each quadrantPlotted line correspond to mean value X-axis tics are plotted every 10th day
Read out noise for each quadrantPlotted line correspond to mean value X-axis tics are plotted every 10th day
Normalized count rate for each quadrant from newest dataIn 3 first points there may be significant shutter effect. Normalization is done using 4th, 5th and 6th points. Light level during the test may not be constant enough to give very reliable result.
Amount of dead pixels (%)X-axis tics are plotted every 10th day
Dead pixel map shows where dead pixels are in latest data. 
Full resolution dead pixel map Amount of hot pixels (%)Fraction of pixels that deviate more than 8-sigma from mean value. Used exposure time was 42 seconds. X-axis tics are plotted every 10th day 
Amount of cold pixels (%)Fraction of pixels that deviate more than 8-sigma from mean value. Used exposure time was 42 seconds. X-axis tics are plotted every 10th day 
Temperature of the arrayMean temperature of the array during test. Minimum and maximum temperatures during the test are indicated by the error bar. X-axis tics are plotted every 10th day 
Dark current count dependency on exp timeRed points correspond to latest data Blue lines refer to 5 previous situations Number of counts per known exp time, 0s included 
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